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napariTFM: An open-source tool for traction force microscopy and monolayer stress microscopy

Fig 4

Validation of Monolayer Stress Microscopy (MSM) analysis.

(A) Square plate analytical validation using a simple geometric test case with a known analytical solution. Stress tensor components (, , ) are shown for ground truth (top row) and MSM-calculated (bottom row) fields. (B) Square plate analysis metrics. Bar charts show correlation coefficients between calculated and ground truth stress fields for each stress component, as well as mean relative error. (C) FEM-simulation–based validation using computational data from a finite element model resembling a snapshot of a migrating cell. Stress tensor components are shown for ground truth (top row) and MSM-calculated (bottom row) fields, with layout as in (A). (D) FEM-simulation validation metrics. Correlation coefficients between calculated and ground truth stress fields are shown for each stress component, as well as absolute and relative error with respect to ground truth sress magnitude.

doi: https://doi.org/10.1371/journal.pcbi.1014045.g004