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Uncertainty-aware traction force microscopy
Fig 8
TFM-UQ captures variability associated with microscopy image quality.
(A) Brightfield image of C3H/10T1/2 cell cultured on fibronectin micropatterned island of length 
(Red dashed outline). (B) “Raw” wide-field fluorescent bead image (beads of size 
). (C) “BGS” Background subtracted image processed from (B). (D, G, J) 
(arrows) overlaid on PIV-UQ uncertainty field (
) corresponding to raw WL-128, BGS WL-128 and BGS WL-64 respectively. Here, WL denotes the PIV interrogation window size WL. (E, H, K) Mean marginal posterior traction stress field (
) corresponding to Raw WL-128, BGS WL-128 and BGS WL-64 respectively. (F, I, L) Traction stress signal-to-noise ratio (
) plotted as a heatmap corresponding to Raw WL-128, BGS WL-128 and BGS WL-64 respectively. Overlaid uncertainty arrows denote the pointwise angular uncertainty corresponding to 1 circular std. dev. of marginal posterior 
. Scale bar: 
.
doi: https://doi.org/10.1371/journal.pcbi.1013079.g008