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Uncertainty-aware traction force microscopy

Fig 6

Synthetic pipeline to simulate experimentally relevant, spatially heterogeneous noise levels in TFM.

(A) Synthetic traction stress generated from four traction islands of Gaussian profile, , one in each quadrant with a maximum stress of . (B) Synthetic displacement field resulting from the traction profile in (A). Substrate of KPa and Poisson’s ratio of 0.45 is used here. (C) Schematic depicting spatially heterogeneous noise addition directly to the synthetic image by varying fluorescent bead density in X-direction. The synthetic image also has image pixel noise equivalent to SNR = 50 (D) Synthetic fluorescent bead image encoding image pixel noise and bead density variations. (E) PIV-UQ deformation measurement of the simulated bead images (D). (F) PIV-UQ estimation of uncertainty (standard deviation ) showing higher uncertainty increasing with x-direction in agreement with noise addition process (C).

Fig 6

doi: https://doi.org/10.1371/journal.pcbi.1013079.g006