Fungal feature tracker (FFT): A tool for quantitatively characterizing the morphology and growth of filamentous fungi
Fig 4
Output of the mycelium characterization function of FFT for different A. oligospora strains.
Changes in the developing mycelium of A. oligospora (strain TWF154) over 72 hours, computed from the time-series of mathematical graphs generated by FFT (Top). A. Change over time of the area covered by mycelium, computed as the convex hull of all nodes in the mathematical graph for each time-point. B. Positions of the hyphal tips at each time-point. C. Overlay of the hyphal segments (edges) at different time-points showing development of the mathematical graph over time. Fungal features detected in images of the TWF154, TWF132 and TWF102 strains after 72 hours of growth (D, E, F, respectively). Area covered by the mycelium (blue polygon), mathematical graph representing the hyphal segments (green network), and hyphal tips (yellow dots) detected by FFT. The graphical representations show changes over time for the number of hyphal tips (G), total mycelial length (H), and the area covered by the mycelium (I), computed as the mean of six replicates per strain and time-point.