Detection and analysis of spatiotemporal patterns in brain activity
Fig 3
Critical point pattern detection performance in simulated data.
A, Mean displacement (in grid spaces) between detected and true critical point location across n = 50 sequences of simulated random critical point patterns for different values of optical flow parameters α and β. Error bars indicate SEM. Outlined points indicate α parameter value used for plots D-F. B, Mean percentage of true patterns missed or misclassified by pattern detection algorithm. C, Mean number of extra, spurious patterns detected per time step. D, Mean false patterns detected per time step (false positive rate) against the percentage of patterns correctly identified (true positive rate) for different parameter values. E-G, Same as A-C, but showing performance under different levels of noise with a fixed value of α. Noise levels are given as the common logarithm of the standard deviation of added white noise relative to average signal amplitude. Outlined points indicate noise level used for plots A-C.