Inhomogeneity Based Characterization of Distribution Patterns on the Plasma Membrane
Fig 1
(A) Computer generated image of an arbitrary point pattern. (B) The widefield microscope acquisition process is simulated. Blur by a point spread function and noise are introduced in the image (A) as shown in S1 Fig. (C) Thresholded image (threshold ‘Default’ was selected from the list of ImageJ/Fiji automatic thresholds). (D) Tessellation of the thresholded image; a number has been assigned to each tile. (E) The tile set generated from the binary image in (C) is applied to the grayscale image in (B) for measuring the intensity of the individual tiles. (F) Schematic of the tile area correction. (G) Histogram of tile areas and a curve fitting of the tile area distribution.