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Automated Transmission-Mode Scanning Electron Microscopy (tSEM) for Large Volume Analysis at Nanoscale Resolution
- Masaaki Kuwajima,
- John M. Mendenhall,
- Laurence F. Lindsey,
- Kristen M. Harris
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- Published: March 26, 2013
- https://doi.org/10.1371/journal.pone.0059573