Mapping a Large Number of QTL for Durable Resistance to Stripe Rust in Winter Wheat Druchamp Using SSR and SNP Markers

• Lu Hou,

  Affiliations Key Laboratory of Agricultural Integrated Pest Management, Institute of Plant Protection, Qinghai Academy of Agriculture and Forestry Sciences, Xining, Qinghai, China, Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America, State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, Shaanxi, China

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• Xianming Chen ,

  * E-mail: xianming@wsu.edu

  Affiliations Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America, US Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, Washington, United States of America

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• Meinan Wang,

  Affiliation Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America

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• Deven R. See,

  Affiliations Department of Plant Pathology, Washington State University, Pullman, Washington, United States of America, US Department of Agriculture, Agricultural Research Service, Wheat Genetics, Quality, Physiology and Disease Research Unit, Pullman, Washington, United States of America

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• Shiaoman Chao,

  Affiliation US Department of Agriculture, Agricultural Research Service, Cereal Crops Research, Fargo, North Dakota, United States of America

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• Peter Bulli,

  Affiliation Department of Crop and Soil Sciences, Washington State University, Pullman, Washington, United States of America

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• Jinxue Jing

  Affiliation State Key Laboratory of Crop Stress Biology in Arid Areas and College of Plant Protection, Northwest A&F University, Yangling, Shaanxi, China

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