Using Pattern Classification to Measure Adaptation to the Orientation of High Order Aberrations

Open Access

Peer-reviewed

Research Article

Lucie Sawides ,

* E-mail: lucie@io.cfmac.csic.es

Affiliation Instituto Óptica, Consejo Superior de Investigaciones Científicas (CSIC), Madrid, Spain
⨯
Carlos Dorronsoro,

Affiliation Instituto Óptica, Consejo Superior de Investigaciones Científicas (CSIC), Madrid, Spain
⨯
Andrew M. Haun,

Affiliation Schepens Eye Research Institute, Massachusetts Eye and Ear Infirmary, Harvard Medical School, Boston, Massachusetts, United States of America
⨯
Eli Peli,

Affiliation Schepens Eye Research Institute, Massachusetts Eye and Ear Infirmary, Harvard Medical School, Boston, Massachusetts, United States of America
⨯
Susana Marcos

Affiliation Instituto Óptica, Consejo Superior de Investigaciones Científicas (CSIC), Madrid, Spain
⨯

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