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Article Source: Using Pattern Classification to Measure Adaptation to the Orientation of High Order Aberrations
Sawides L, Dorronsoro C, Haun AM, Peli E, Marcos S (2013) Using Pattern Classification to Measure Adaptation to the Orientation of High Order Aberrations. PLOS ONE 8(8): e70856. https://doi.org/10.1371/journal.pone.0070856

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