-
Loading metrics
Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy
- Nalan Liv,
- A. Christiaan Zonnevylle,
- Angela C. Narvaez,
- Andries P. J. Effting,
- Philip W. Voorneveld,
- Miriam S. Lucas,
- James C. Hardwick,
- Roger A. Wepf,
- Pieter Kruit,
- Jacob P. Hoogenboom
x
- Published: February 8, 2013
- https://doi.org/10.1371/journal.pone.0055707