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Electronics engineering

A facile hydrothermal approach for catalytic and optical behavior of tin oxide- graphene (SnO₂/G) nanocomposite

Suresh Sagadevan, Zaira Zaman Chowdhury, [ ... ], Md Enamul Hoque

Association of physical activity and sedentary time with blood cell counts: National Health and Nutrition Survey 2003-2006

Erik A. Willis, Joseph J. Shearer, Charles E. Matthews, Jonathan N. Hofmann

In-field determination of soil ion content using a handheld device and screen-printed solid-state ion-selective electrodes

Ron Rosenberg, Michael S. Bono Jr., [ ... ], A. John Hart

GC4S: A bioinformatics-oriented Java software library of reusable graphical user interface components

Hugo López-Fernández, Miguel Reboiro-Jato, [ ... ], Florentino Fdez-Riverola

Flow field characteristics and coal dust removal performance of an arc fan nozzle used for water spray

Fangwei Han, Jian Liu

Association between age at onset of independent walking and objectively measured sedentary behavior is mediated by moderate-to-vigorous physical activity in primary school children

Tomoko Aoyama, Shigeho Tanaka, [ ... ], Chiaki Tanaka

Modeling and impedance matching for radio frequency driven plasma lamp considering cold and hot states

Wonshil Kang, Hyunchul Ku

Potentiometric titration for the high precision determination of active components in six types of chemical disinfectants

Jiansheng Liang, Junsheng Zhu, [ ... ], Bin Wang

Development and validation of an ensemble classifier for real-time recognition of cow behavior patterns from accelerometer data and location data

Jun Wang, Zhitao He, [ ... ], Kaixuan Zhao

The utility of two interview-based physical activity questionnaires in healthy young adults: Comparison with accelerometer data

René Schilling, Eveline Schärli, [ ... ], Markus Gerber

Testing for physical validity in molecular simulations

Pascal T. Merz, Michael R. Shirts

Software tools for cell culture-related 3D printed structures

Marton Gulyas, Miklos Csiszer, Elod Mehes, Andras Czirok

A debug scheme to improve the error identification in post-silicon validation

Inhyuk Choi, Won Jung, Hyunggoy Oh, Sungho Kang

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