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Strategic SA-UNet: Integrating self-attention blocks into U-Net for efficient crack segmentation

Ryota Kobayashi, Munehiro Kimura,  [ ... ], Masahiro Iwahashi

Defect detection method of printed circuit boards based on EDF-YOLOv10

Zhijuan Shen, Yonger Yao,  [ ... ], Lijun Lu

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