Fig 1.
General scheme of stages for optimizing coating thickness gauges using robust parametric design.
Fig 2.
The design of the surface eddy current transformer rectangular thickness gauge of dielectric coatings.
Fig 3.
Scheme for creating a design of Taguchi’s experiments.
Fig 4.
Measurement process parameters and their ranges of variation.
Table 1.
The design of experiments for interfering parameters.
Table 2.
The design of experiments for controllable parameters.
Fig 5.
Ratio at medium frequency measurement mode.
Fig 6.
S/N values for all analyzed designs of the medium frequency eddy current gauges.
Table 3.
Parameters of ECP designs.
Fig 7.
Verification of the normality of the distribution of the research data for (a) p-value diagram, (b) factual value of the Shapiro-Wilk criterion.
Fig 8.
Data of normality distribution check for the design of meter No. 3 with DOE.
Table 4.
Results of ANOVA-analysis of data for the dielectric coating thickness meter.