Table 1.
Comparison of the previous and proposed methods.
Fig 1.
Insulator with contamination and LC.
Table 2.
Pollution severity readings.
Fig 2.
Leakage current data condition on normal distribution.
Table 3.
Definition of indices behavior.
Fig 3.
Border area scaling of C2-C6 in normal distribution.
Fig 4.
Proposed Methodology Flowchart.
Fig 5.
Summary schematic of condition rule.
Fig 6.
Failure estimation of Wt indicator
(a) Wt = 0 (b) Wt = 3 (c) Wt = 6 (d) Wt = 9.
Fig 7.
Failure estimation of SDD indicator
(a) SDD = 0.05 (b) SDD = 0.12 (c) SDD = 0.2.
Fig 8.
Failure estimation of NSDD indicator
(a) NSDD = 0.15 (b) NSDD = 0.25 (c) NSDD = 0.35.
Fig 9.
MDM comparison for Wt mode in (a) time domain condition (b) frequency domain condition (c) overall condition.
Fig 10.
(a) Wt = 0 (b) Wt = 3 (c) Wt = 6 (d) Wt = 9.
Fig 11.
MDM comparison for SDD mode in (a) time domain condition (b) frequency domain condition (c) overall condition.
Fig 12.
(a) SDD = 0.05 (b) SDD = 0.12 (c) SDD = 0.2.
Fig 13.
MDM comparison for NSDD mode in (a) time domain condition (b) frequency domain condition (c) overall condition.
Fig 14.
MDM comparison for (a) NSDD = 0.15 (b) NSDD = 0.25 (c) NSDD = 0.35.
Table 4.
Failure probability and CFP of all condition.
Fig 15.
CFP analysis.