Fig 1.
Flowchart of the overall experimental process.
This figure illustrates the sequential steps involved in the research experiment.
Fig 2.
Combined view of the hardware setup for determining the dielectric constant value of a material: Dielectric-free perspective, front view with FR4 substrate, and perspective view with FR4 substrate.
Table 1.
Parameters for the lens system used in the characterization of a dielectric material.
Fig 3.
Design view of the complete hardware setup incorporating a patch antenna for precise determination of the dielectric constant value of a material.
Fig 4.
Practical setup of a microwave system for measuring the dielectric constant of FR4 in free space.
The system includes a microwave source, lens, and receiving antenna.
Fig 5.
Advance integrated setup with horn antenna and FR4 for precise dielectric value determination.
Fig 6.
(a) Front view and (b) Back view of the truncated ground plane ring type patch antenna.
Fig 7.
Advanced microwave hardware setup with circular ring patch antenna, lens pair, for accurate dielectric value determination”.
Fig 8.
Reflection Coefficient Graphs of a Transmission System in Free Space between Transmitter and Receiver (a) Sample-Free and Lens-Free Transmission (b) Lenses-Free Transmission System with a Sample (c) A Sample-Free Transmission System with Lenses (d) Transmission System with Lenses and a Sample.
Table 2.
Permittivity values, 10G Hz to 11.5 GHz with and without Lens.
Fig 9.
Dielectric permittivity of FR4 graph as a function of frequency ranging 10 GHz to 11.5 GHz.
Fig 10.
Dielectric permittivity of FR4 graph as a function of frequency ranging 10 GHz to 11.5 GHz.
Table 3.
Comparison of dielectric measurement techniques.