Fig 1.
Schematic of GH shift in defect superconductor PC.
Fig 2.
(a) Transmittance and reflectance of light waves changing with the normalized frequency for P = 0 GPa. (b, c) Transmittance and reflectance around the defect mode for different values of hydrostatic pressure, respectively. The environment temperature is set as Te = 50 K for (a)-(c).
Fig 3.
(a, c) Phase of reflection coefficient and GH shift of reflected beam changing with the frequency around the defect mode for different values of hydrostatic pressure, respectively. (b, d) Phase of reflection coefficient and GH shift in the parameter space composed of hydrostatic pressure and frequency, respectively. Environment temperature is given by Te = 50 K.
Fig 4.
(a, b) Transmittance and reflectance of light waves around the defect modes for different values of environment temperature, respectively. (c) Reflection coefficient phase changing with the frequency near the defect mode for different values of environment temperature. (d) GH shift of reflected beam for different values of environment temperature. Hydrostatic pressure is set as P = 0 GPa and incident angle is θ = 10° for (a)-(d).
Fig 5.
(a) Sensitivity coefficient of GH shift to incident wavelength near the defect mode for different values of hydrostatic pressure. (b) Sensitivity coefficient of GH shift to incident wavelength for different values of environment temperature. Enviroment temperature is set as Te = 50 K for (a). Hydrostatic pressure is set as P = 0 GPa for (b). Incident angle is given by θ = 10° for (a) and (b).
Fig 6.
(a) GH shift in parameter space composed of environment temperature and normalized frequency. (b) GH shift changing with environment temperature.