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Fig 1.

Two different sets of {111} planes for diamond- and sphalerite-structured crystals.

The circle and quadrilateral symbols represent the atoms in and below the plane of paper, respectively.

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Fig 1 Expand

Table 1.

Key quantities for studying dislocations in Si, GaAs, InP and CdTe.

The lattice constant a and mechanical parameters are respectively in units of Å and GPa.

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Table 1 Expand

Fig 2.

The γ-surface and restoring force.

Discrete points represent the numerical results.

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Fig 2 Expand

Table 2.

The fitting parameters γi in unit of J/m2.

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Table 2 Expand

Fig 3.

The maps of dislocation densities obtained from LTOD.

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Fig 3 Expand

Fig 4.

The comparison of dislocation profiles/densities for GaAs obtained by classical PN model and LTOD.

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Fig 4 Expand

Table 3.

The results of λ and ζ calculated from LTOD.

λPN and ζPN are the results of neglecting the SE. ζPN and ζ are in unit of Å.

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Table 3 Expand

Fig 5.

The projection of the dislocation in glide plane.

The black and red symbols respectively stand for atoms in and below the plane of paper. The deformation is represented by relative displacement of black circles for simplicity. The distance along b between dotted line and solid line in (b) represents relative displacement.

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Fig 5 Expand

Fig 6.

The energy curves for GaAs.

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Fig 6 Expand

Table 4.

The calculated results of Peierls stress in unit of GPa.

Where subscripts p and PN correspond to the results of considering and neglecting the SE, respectively. The superscript m corresponds to consider Emisfit only, and m + s corresponds to consider Emisfit and Estrain simultaneously. τexp is the experimental result taken from Ref. [15] except that of Si is taken form Ref [42]. τCPN and τDPN are the results of Ref. [16] and Ref. [19], respectively.

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Table 4 Expand

Fig 7.

The original γ-surface for glide set of Si given by Joos et al. and its corresponding effective γ-surface.

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Fig 7 Expand

Table 5.

The fitting parameters of the original and effective γ-surfaces for 30° partial dislocation in Si, and the calculated Peierls stress.

The Peierls stress and fitting parameters are in units of GPa and J/m2, respectively. The result calculated by Joos et al. using classical PN model is also shown in parenthesis.

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Table 5 Expand

Fig 8.

The influence of SE on Emisfit and Estrain.

The thick and dashed lines correspond to the results without and with considering the SE, respectively.

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Fig 8 Expand