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Fig 1.

The flowchart of the proposed method.

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Fig 1 Expand

Table 1.

The specification of raw MAT images.

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Table 1 Expand

Table 2.

The specification of scale normalized MAT images.

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Table 2 Expand

Fig 2.

An image and its image features.

(A) An image. (B)-(F) The 0-th to 4-th level wavelet coefficients of (A) (Wavelet-0, , Wavelet-4). (G)-(K) The histogram of the 0-th to 4-th level wavelet coefficients of (A) (HoW-0, , HoW-4).

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Fig 2 Expand

Table 3.

The specification of scale normalized MAT images.

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Table 3 Expand

Table 4.

The dimensionality of the image features.

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Table 4 Expand

Fig 3.

The elapsed time of the image processing steps [msec.].

(A) The elapsed time of pre-processing. (B) The elapsed time of feature extraction.

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Fig 3 Expand

Fig 4.

The t-SNE 2D embedding of the features at the resolution of 256 × 256.

(A) Image, (B) Wavelet-3, and (C) HoW-3. Red (x) and purple (+) symbols represent the features of negative and positive patches respectively.

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Fig 4 Expand

Fig 5.

A comparison of HoW-0 and HoW-4 features of patch size 256 × 256.

(A)-(C) HoW-0 features of Negative data. (D)-(F) HoW-4 features of Negative data. (G)-(I) HoW-0 features of Positive data. (J)-(L) HoW-4 features of Positive data.

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Fig 5 Expand

Fig 6.

Visualized confusion matrix and MCC for each feature of different patch sizes.

(A) Patch size 256 × 256. (B) Patch size 512 × 512.

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Fig 6 Expand

Fig 7.

A comparison of HoW-0 and HoW-4 features from the test cases of patch size 256 × 256.

Representative (A) HoW-0 and (B) HoW-4 features of true negative (TN), false negative (FN), false positive (FP) and true positive (TP) cases.

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Fig 7 Expand

Table 5.

The elapsed time for training per dataset [sec.].

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Table 5 Expand

Table 6.

The elapsed time for test per patch [msec.].

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Table 6 Expand