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Table 1.

Irradiation treatment schedule for all 6 HRPTEC samples.

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Fig 1.

Diagram of experiment design.

Four cartridges (A, B, C, D) were used to profile miRNA expression of 6 duplicated biological samples. Two RNA preparation methods and two scanners were combined for different cartridges. Effects in ANOVA models are labeled in green color.

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Fig 2.

Heat-map of all cartridges.

Signal intensity is in log2 scale, red represents higher expression levels, green represents lower expression levels, and black represents medium expression levels. Hierarchical clustering dendrograms are drawn on the heat-map for both microRNAs and biological samples. Samples and cartridges information were listed in legends.

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Fig 3.

LOESS curve fitting of RMS against average expression levels for the comparison at the first time scan.

Variance components of ANOVA models were smoothed over average log2 expression levels through the LOESS fit. Blue curve represents variability of biological samples. Red curve represents variability of PrepStation. Green curve represents variability of scanners. Black curve represents variability of residual errors.

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Fig 3 Expand

Fig 4.

LOESS curve fitting of RMS against average expression levels for the comparison at the second time scan.

Variance components of ANOVA models were smoothed over average log2 expression levels through LOESS fit. Blue curve represents variability of biological samples. Red curve represents variability of PrepStation and scanners. Green curve represents variability of cartridges. Black curve represents variability of residual errors.

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Fig 4 Expand

Fig 5.

LOESS curve fitting of RMS against average expression levels for the comparison across both time scans.

Variance components of ANOVA models were smoothed over average log2 expression levels through the LOESS fit. Blue curve represents variability of biological samples. Red curve represents variability of PrepStation and scanners. Green curve represents variability of scan times. Black curve represents variability of residual errors.

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Fig 5 Expand