Table 1.
Effect of the energy deposition threshold adopted in the light yield calculation.
The ratio was calculated by (light yield with 3.7 eV threshold)-(light yield with 8.76 eV threshold)/(Light yield with 3.7 eV threshold) * 100.
Fig 1.
Calculation scheme of the track-structure method.
Beam incident direction is defined as y axis.
Fig 2.
Light yields of NE-102A irradiated by protons and electrons of various energies.
Simulation was based on the track-structure method. “This study” denotes the values obtained by the track-structure method. Dashed and solid lines denote fitting by Birks’ formula [1] and Chou’s formula [19], respectively. The other values are experimental data from the literature.
Fig 3.
Light yield of NE-102A irradiated by energetic heavy ions (150—550 AMeV).
Dashed and solid lines denote the fitting by Birks’ formula and Chou’s formula, respectively.
Fig 4.
Light yield of NE-102A irradiated by low energy heavy ions (- 160 MeV).
Fig 5.
Same as Fig 4 but horizontal axis is LET.
Vertical axis is (a) light yield or (b) light yield per deposited energy.
Fig 6.
Deposition energy spectra integrated over entire volume calculated by RITRACKS.
Fig 7.
Light yields of NE-102A irradiated by protons.
Calc. 3, 4, and 5 are the data calculated by track-structure method for 3, 4 and 5 nm of Förster radius, respectively. The other values are experimental data from the literature.
Fig 8.
Comparison of measured and simulated light yields of NE-102A irradiated by protons and electrons at various energies.
Simulation was based on the SE method.
Fig 9.
Comparison of measured and simulated light yields of NE-102A irradiated by energetic heavy ions (100—1000 AMeV).
Simulation was based on the SE method.
Fig 10.
Comparison of measured and simulated light yields of NE-102A irradiated by low-energy heavy ions (- 160 MeV).
Simulation was based on the SE method.
Fig 11.
Schematic diagram of the mechanism to overestimate light yield by SE method.