Table 1.
Workpiece properties and cutting conditions.
Fig 1.
15 samples machined by SPDT at different feed rates.
Fig 2.
Measurement image of the diamond tool tip radius an Olympus BX60 microscope.
Fig 3.
Reflectance measuring device.
Fig 4.
Results of normalized reflectance of 15 samples machined by single point diamond turning.
Fig 5.
Chips measured by the Hitachi electron microscope TM3000, (a) feed rate is 7 mm/min, (b) feed rate is 3 mm/min.
Fig 6.
SEM images and EDX results of surfaces when the feed rates are 1 mm/min (a) and 7 mm/min (b), separately.
Fig 7.
SEM images of surfaces when the feed rates are 1 mm/min (a) and 7 mm/min (b), respectively.
Fig 8.
(a) Si phase is removed when feed rate occurs under optimal conditions (b) Si phase is embedded into surface when the feed rate is too low.