Fig 1.
Illustration of the scanning means of IXCTs.
Fig 2.
(a) An analog model, (b) A PMMA cylindrical container.
Fig 3.
(a) Illustration of the consecutive short-scan CT trajectory; (b) Consecutive short-scan CT system in the integration: 1. X-ray tube; 2. Linear array detector; 3. Circular guide rail; 4. Suspended frame; 5. Supporting truss girder; 6. High-voltage generator; 7. Cooling system; 8. Sample stage; 9.Analog model.
Fig 4.
Illustration of elimination of the invalid data in a raw sinogram.
Fig 5.
(a) Illustration of geometrical symmetry of fan-beam CT; (b) Illustration of data supplement to achieve a complete sinogram.
Fig 6.
(a) The finished consecutive short-scan CT system; (b) In-situ CT scanning of an analog model in extrusion process.
Fig 7.
Raw sinogram and SSIM distributions.
(a) A raw sinogram including invalid data at both ends, we can see that the invalid data are collected at a non-rotational stage and they are nearly the same, thus, they are strip-like on the raw sinogram; (b) SSIM distributions of dataset P1 and P2. We can find that from the beginning, SSIMs are almost close to 1 for a distance, then a distinct drop arises and SSIM goes on changing on a lower level. Thus, we have the reason to believe that the inflection points are the exact positions where 0° & 270°-projections lie.
Fig 8.
Reconstructed images by different sinograms (a) Reconstructed image by a raw sinogram, geometrical distortion artifacts are produced due to the invalid data and a non-360°-sinogram involved in the back-projection; (b) Reconstructed image by an accurate 270°-sinogram, due to the unclosed back-projection operation, some detailed textures are lost and weak string artifacts exist; (c) Artifacts-free reconstructed image by an complemented 360°-sinogram.
Table 1.
Experimental parameters in a short CT scanning.
Fig 9.
Typical cross-sectional slices and 3D virtual models of an analog model.