Figure 1.
Survival configurations for simulation of power.
* λi denotes the hazard function of Si(t), a piecewise exponential distribution. † W(η, θ) denotes a Weibull distribution having S(t) = exp{(-t / θ)η}, where η>0 is the shape parameter, θ>0 is the scale parameter.
Table 1.
Power of test procedures for Situation 1.
Table 2.
Power of test procedures for Situation 2.
Table 3.
Power of test procedures for Situation 3.
Table 4.
Power of test procedures for Situation 4.
Table 5.
Type I error of test procedures.
Figure 2.
Estimated survival functions for Example 1, 2, and 3.
Table 6.
The results of various procedures for three Examples.