Advertisement

Browse Subject Areas

?

Click through the PLOS taxonomy to find articles in your field.

For more information about PLOS Subject Areas, click here.

< Back to Article

A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention

Fig 18

Impact of histogram equalization on ‘Local’ defect class.

Fig 18

doi: https://doi.org/10.1371/journal.pone.0346595.g018