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A knowledge tracing approach with dual graph convolutional networks and positive/negative feature enhancement network

Fig 1

The proposed model, which is divided into three parts.

The dual Graph convolution network (Dual-GCN) module, Clustering-Optimized module, and Positive/Negative Features Enhancement Network (P/N-FEN) module. A and B represent adjacency matrices, respectively.

Fig 1

doi: https://doi.org/10.1371/journal.pone.0317992.g001