Compositional, ultrastructural and nanotechnological characterization of the SMA strain of Saccharomyces pastorianus: Towards a more complete fermentation yeast cell analysis
Fig 5
TOF-SIMS depth profiling analysis of the SMA strain of Saccharomyces pastorianus grown in the fermentative glucose-containing YM media for 24 h, 48 h and 72 h.
The negative atomic ions C-, NH-, O-, OH-, P- and S- were monitored. The intensities were normalized at each sputtering time and are expressed as % relative intensity.