A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
Figure 9
Maximum likelihood estimation for spurious charge (electrons/pixel) and readout noise (electrons).
Shown are the samples of the likelihood function (see Material and Methods) of readout noise and spurious charge for a set of dark images. The images for (A) and (B) were taken with 3 MHz and 10 MHz readout rates respectively. The manufacturer gives ca. 53 electrons readout noise for the settings used for (A) and ca. 32 electrons readout noise for the settings used for (B).