A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention

• Sharith Dhar,

  Roles Conceptualization, Writing – original draft

  Affiliation Department of Electronics and Telecommunication Engineering, Chittagong University of Engineering & Technology, Chittagong, Bangladesh

  ⨯
• Fahmid Al Farid,

  Roles Formal analysis, Validation, Visualization

  Affiliation Centre for Image and Vision Computing (CIVC), COE for Artificial Intelligence, Faculty of Artificial Intelligence and Engineering (FAIE), Multimedia University, Cyberjaya, Selangor, Malaysia

  https://orcid.org/0000-0003-2625-2348

  ⨯
• Md Saiful Islam ,

  Roles Supervision, Writing – review & editing

  * E-mail: saiful05eee@cuet.ac.bd (MSI), sarina.mansor@mmu.edu.my (SM)

  Affiliation Department of Electronics and Telecommunication Engineering, Chittagong University of Engineering & Technology, Chittagong, Bangladesh

  https://orcid.org/0000-0001-7983-4398

  ⨯
• Jia Uddin,

  Roles Visualization, Writing – review & editing

  Affiliation AI and Big Data Department, Woosong University, Daejeon, South Korea

  ⨯
• Sarina Mansor

  Roles Funding acquisition, Resources, Software

  * E-mail: saiful05eee@cuet.ac.bd (MSI), sarina.mansor@mmu.edu.my (SM)

  Affiliation Centre for Image and Vision Computing (CIVC), COE for Artificial Intelligence, Faculty of Artificial Intelligence and Engineering (FAIE), Multimedia University, Cyberjaya, Selangor, Malaysia

  ⨯