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EFEN-YOLOv8: Surface defect detection network based on spatial feature capture and multi-level weighted attention
- Meishun Wu,
- Jinmin Peng,
- Xinyi Yu,
- Heng Xu,
- Haotian Sun
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- Published: January 2, 2026
- https://doi.org/10.1371/journal.pone.0339617