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Beyond accuracy: Quantifying the reliability of multiple instance learning for whole slide image classification
- Hassan Keshvarikhojasteh,
- Marc Aubreville,
- Christof A. Bertram,
- Josien P. W. Pluim,
- Mitko Veta
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- Published: December 5, 2025
- https://doi.org/10.1371/journal.pone.0337261