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SCP-DETR: A efficient small-object-enhanced feature pyramid approach for PCB defect detection
- Yuanyuan Wang,
- Tongtong Yin,
- Xiuchuan Chen,
- Yemeng Zhu,
- Jibin Wang,
- Yonghao Ma,
- Luyue Liu,
- Jiajun Wang
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- Published: August 29, 2025
- https://doi.org/10.1371/journal.pone.0330039