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Oak-YOLO: A high-performance detection model for automated Oak seed defect identification
- Hao Li,
- Zhuqi Li,
- Dongkui Chen,
- Wangyu Wu,
- Xuanlong He,
- Hongbo Mu
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- Published: August 8, 2025
- https://doi.org/10.1371/journal.pone.0327371