The modeling and condition analysis of nondestructive testing based on ESPI for internal defects of materials

• Wen Wang,

  Roles Methodology, Writing – original draft

  Affiliations School of Mechanical Engineering, Tiangong University, Tianjin, China, Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin, China

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• Mingzhi Lv,

  Roles Data curation

  Affiliations Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin, China, School of Electronics and Information Engineering, Tiangong University, Tianjin, China

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• Fang Zhang ,

  Roles Project administration, Writing – review & editing

  * E-mail: hhzhangfang@126.com

  Affiliations Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin, China, School of Life Sciences, Tiangong University, Tianjin, China

  https://orcid.org/0000-0002-3876-8192

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• Zhitao Xiao,

  Roles Writing – review & editing

  Affiliations Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin, China, School of Life Sciences, Tiangong University, Tianjin, China

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• Wenheng Li

  Roles Methodology, Validation

  Affiliations School of Electronics and Information Engineering, Tiangong University, Tianjin, China, Tianjin Key Laboratory of Optoelectronic Detection Technology and Systems, Tianjin, China

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