SAMF-YOLO: A self-supervised, high-precision approach for defect detection in complex industrial environments

• Jun Huang ,

  Roles Conceptualization, Methodology, Project administration, Resources, Validation, Writing – original draft, Writing – review & editing

  * E-mail: huangjun1207@whit.edu.cn

  Affiliations Faculty of Intelligent Manufacturing, Wuhu Institute of Technology, Anhui, China, Faculty of Information Technology, City University Malaysia, Kuala Lumpur, Malaysia

  https://orcid.org/0009-0006-8549-4098

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• Shamsul Arrieya Ariffin,

  Roles Supervision

  Affiliations Faculty of Information Technology, City University Malaysia, Kuala Lumpur, Malaysia, Faculty of Computing and Meta Technology, Sultan Idris Education University, Perak, Malaysia

  https://orcid.org/0000-0001-6266-6797

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• Qiang Zhu,

  Roles Data curation

  Affiliation Faculty of Intelligent Manufacturing, Wuhu Institute of Technology, Anhui, China

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• Wanting Xu,

  Roles Formal analysis

  Affiliations Faculty of Information Technology, City University Malaysia, Kuala Lumpur, Malaysia, Faculty of Automotive and Aviation, Wuhu Institute of Technology, Anhui, China

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• Qun Yang

  Roles Conceptualization, Software

  Affiliation Faculty of Intelligent Manufacturing, Wuhu Institute of Technology, Anhui, China

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