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Expression of Concern

Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications

The PLOS ONE Editors

Expression of Concern: Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications

The PLOS ONE Editors

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Published: June 29, 2023
https://doi.org/10.1371/journal.pone.0288213

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