Graph-based machine learning improves just-in-time defect prediction

• Jonathan Bryan ,

  Contributed equally to this work with: Jonathan Bryan, Pablo Moriano

  Roles Data curation, Investigation, Software, Visualization

  * E-mail: jz699j@att.com (JB); moriano@ornl.gov (PM)

  Affiliation AT&T Cybersecurity, AT&T, Atlanta, GA, United States of America

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• Pablo Moriano

  Contributed equally to this work with: Jonathan Bryan, Pablo Moriano

  Roles Conceptualization, Formal analysis, Funding acquisition, Investigation, Methodology, Project administration, Resources, Supervision, Validation, Visualization, Writing – original draft, Writing – review & editing

  * E-mail: jz699j@att.com (JB); moriano@ornl.gov (PM)

  Affiliation Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States of America

  https://orcid.org/0000-0002-1822-8885

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