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Preparation of hybrid samples for scanning electron microscopy (SEM) coupled to focused ion beam (FIB) analysis: A new way to study cell adhesion to titanium implant surfaces
- Ludovica Parisi,
- Andrea Toffoli,
- Benedetta Ghezzi,
- Paola Lagonegro,
- Giovanna Trevisi,
- Guido M. Macaluso
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- Published: August 2, 2022
- https://doi.org/10.1371/journal.pone.0272486