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The reliability of the angle of deviation measurement from the Photo-Hirschberg tests and Krimsky tests
- S. Tengtrisorn,
- A. Tungsattayathitthan,
- S. Na Phatthalung,
- P. Singha,
- N. Rattanalert,
- S. Bhurachokviwat,
- S. Chouyjan
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- Published: December 1, 2021
- https://doi.org/10.1371/journal.pone.0258744