Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications

Open Access

Peer-reviewed

Research Article

Ting Su ,

* E-mail: 14110190063@fudan.edu.cn

Affiliation State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai, China
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Haifeng Zhang

Affiliation Department of Physics, Jiamusi University, Jiamusi, China
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Zinc
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Semiconductors
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Copper
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Electronic properties
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Chemical vapor deposition
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Electrostatics
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Oxygen
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Lasers
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