-
Loading metrics
Free Form Deformation–Based Image Registration Improves Accuracy of Traction Force Microscopy
- Alvaro Jorge-Peñas,
- Alicia Izquierdo-Alvarez,
- Rocio Aguilar-Cuenca,
- Miguel Vicente-Manzanares,
- José Manuel Garcia-Aznar,
- Hans Van Oosterwyck,
- Elena M. de-Juan-Pardo,
- Carlos Ortiz-de-Solorzano,
- Arrate Muñoz-Barrutia
x
- Published: December 7, 2015
- https://doi.org/10.1371/journal.pone.0144184