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eSIP: A Novel Solution-Based Sectioned Image Property Approach for Microscope Calibration
- Malte Butzlaff,
- Arwed Weigel,
- Evgeni Ponimaskin,
- Andre Zeug
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- Published: August 5, 2015
- https://doi.org/10.1371/journal.pone.0134980
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