-
Loading metrics
Quantitative Localization Microscopy: Effects of Photophysics and Labeling Stoichiometry
- Robert P. J. Nieuwenhuizen,
- Mark Bates,
- Anna Szymborska,
- Keith A. Lidke,
- Bernd Rieger,
- Sjoerd Stallinga
x
- Published: May 20, 2015
- https://doi.org/10.1371/journal.pone.0127989