Evaluation of Wheat Chromosome Translocation Lines for High Temperature Stress Tolerance at Grain Filling Stage

Open Access

Peer-reviewed

Research Article

Gautam Prasad Pradhan,

Affiliation Williston Research Extension Center, North Dakota State University, Williston, North Dakota, United States of America
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P. V. Vara Prasad

* E-mail: vara@ksu.edu

Affiliation Department of Agronomy, Kansas State University, Manhattan, Kansas, United States of America
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Leaves
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Wheat
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Chlorophyll
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Thermal stresses
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Chromosomal translocations
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Superoxide dismutase
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Plant resistance to abiotic stress
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Superoxides
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