Simultaneous Analysis and Quality Assurance for Diffusion Tensor Imaging

• Carolyn B. Lauzon,

  Affiliations Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America, Institute of Imaging Science, Vanderbilt University, Nashville, Tennessee, United States of America

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• Andrew J. Asman,

  Affiliation Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America

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• Michael L. Esparza,

  Affiliation Department of Computer Science, Vanderbilt University, Nashville, Tennessee, United States of America

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• Scott S. Burns,

  Affiliation Special Education, Vanderbilt University, Nashville, Tennessee, United States of America

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• Qiuyun Fan,

  Affiliations Institute of Imaging Science, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America

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• Yurui Gao,

  Affiliations Institute of Imaging Science, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America

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• Adam W. Anderson,

  Affiliations Institute of Imaging Science, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America

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• Nicole Davis,

  Affiliation Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, Tennessee, United States of America

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• Laurie E. Cutting,

  Affiliations Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, Tennessee, United States of America, Special Education, Vanderbilt University, Nashville, Tennessee, United States of America

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• Bennett A. Landman

  * E-mail: bennett.landman@vanderbilt.edu

  Affiliations Department of Electrical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America, Institute of Imaging Science, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, Tennessee, United States of America, Department of Biomedical Engineering, Vanderbilt University, Nashville, Tennessee, United States of America

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