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Analysis of Four Aberrometers for Evaluating Lower and Higher Order Aberrations
- Fabiano Cade,
- Andrea Cruzat,
- Eleftherios I. Paschalis,
- Lilian Espírito Santo,
- Roberto Pineda
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- Published: January 22, 2013
- https://doi.org/10.1371/journal.pone.0054990