-
Loading metrics
Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues
- Heinz Horstmann,
- Christoph Körber,
- Kurt Sätzler,
- Daniel Aydin,
- Thomas Kuner
x
- Published: April 16, 2012
- https://doi.org/10.1371/journal.pone.0035172