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Article Source: A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention
Dhar S, Al Farid F, Islam MS, Uddin J, Mansor S (2026) A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention. PLOS ONE 21(4): e0346595. https://doi.org/10.1371/journal.pone.0346595

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