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EFEN-YOLOv8: Surface defect detection network based on spatial feature capture and multi-level weighted attention
Wu M,
Peng J,
Yu X,
Xu H,
Sun H
(2026)
EFEN-YOLOv8: Surface defect detection network based on spatial feature capture and multi-level weighted attention.
PLOS ONE 21(1): e0339617.
https://doi.org/10.1371/journal.pone.0339617