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New generalized-X family: Modeling the reliability engineering applications
Wang W,
Ahmad Z,
Kharazmi O,
Ampadu CB,
Hafez EH,
et al.
(2021)
New generalized-X family: Modeling the reliability engineering applications.
PLOS ONE 16(3): e0248312.
https://doi.org/10.1371/journal.pone.0248312